Skip to main content
English
中文
Log In
Log in
Log in with ORCID
NTU Single Sign On
Have you forgotten your password?
Home
College of Electrical Engineering and Computer Science / 電機資訊學院
Electronics Engineering / 電子工程學研究所
Jump Scan: A DFT Technique for Low Power Testing,
Details
Jump Scan: A DFT Technique for Low Power Testing,
Journal
IEEE VLSI Test Symposium
Pages
277-282
Date Issued
2005-05
Author(s)
CHIEN-MO LI
M.H. Chiu
CHIEN-MO LI
DOI
10.1109/vts.2005.51
URI
http://scholars.lib.ntu.edu.tw/handle/123456789/318035
Type
conference paper