https://scholars.lib.ntu.edu.tw/handle/123456789/324147| Title: | Abnormal trend detection of sequence-disordered data using EWMA method | Authors: | Fan, Jr-Min Guo, Ruey-Shan Chang, Shi-Chung Lee, Jian-Huei SHI-CHUNG CHANG |
Issue Date: | 1996 | Start page/Pages: | 169-174 | Source: | IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop | URI: | http://www.scopus.com/inward/record.url?eid=2-s2.0-0030395438&partnerID=MN8TOARS http://scholars.lib.ntu.edu.tw/handle/123456789/324147 |
| Appears in Collections: | 電機工程學系 |
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