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College of Electrical Engineering and Computer Science / 電機資訊學院
Electrical Engineering / 電機工程學系
Abnormal trend detection of sequence-disordered data using EWMA method
Details
Abnormal trend detection of sequence-disordered data using EWMA method
Journal
IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop
Pages
169-174
Date Issued
1996
Author(s)
Fan, Jr-Min
Guo, Ruey-Shan
Chang, Shi-Chung
Lee, Jian-Huei
SHI-CHUNG CHANG
DOI
10.1109/asmc.1996.557991
URI
http://www.scopus.com/inward/record.url?eid=2-s2.0-0030395438&partnerID=MN8TOARS
http://scholars.lib.ntu.edu.tw/handle/123456789/324147
Type
conference paper