Abnormal trend detection of sequence-disordered data using EWMA method

Journal

IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop

Pages

169-174

Date Issued

1996

Author(s)

Fan, Jr-Min

Guo, Ruey-Shan

Chang, Shi-Chung

Lee, Jian-Huei

SHI-CHUNG CHANG

DOI

10.1109/asmc.1996.557991

URI

http://www.scopus.com/inward/record.url?eid=2-s2.0-0030395438&partnerID=MN8TOARS

http://scholars.lib.ntu.edu.tw/handle/123456789/324147

Type

conference paper