https://scholars.lib.ntu.edu.tw/handle/123456789/351960
DC Field | Value | Language |
---|---|---|
dc.contributor.author | H. J. Hung | en_US |
dc.contributor.author | J. B. Kuo | en_US |
dc.contributor.author | C. T. Tsai | en_US |
dc.contributor.author | D. Chen | en_US |
dc.contributor.author | JAMES-B KUO | zz |
dc.creator | H. J. Hung;J. B. Kuo;C. T. Tsai;D. Chen | - |
dc.date.accessioned | 2018-09-10T07:41:38Z | - |
dc.date.available | 2018-09-10T07:41:38Z | - |
dc.date.issued | 2009-12 | - |
dc.identifier.uri | http://scholars.lib.ntu.edu.tw/handle/123456789/351960 | - |
dc.language | en | en |
dc.relation.ispartof | International Semiconductor Devices Research Symposium | en_US |
dc.source | AH-anncc | - |
dc.title | Floating-Body-Effect-Related Gate Tunneling Leakage Current Phenomenon of 40nm PD SOI NMOS Device | - |
dc.type | conference paper | en |
dc.identifier.scopus | 2-s2.0-77949414328 | - |
item.openairecristype | http://purl.org/coar/resource_type/c_5794 | - |
item.openairetype | conference paper | - |
item.grantfulltext | none | - |
item.cerifentitytype | Publications | - |
item.fulltext | no fulltext | - |
crisitem.author.dept | Electrical Engineering | - |
crisitem.author.parentorg | College of Electrical Engineering and Computer Science | - |
Appears in Collections: | 電機工程學系 |
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