https://scholars.lib.ntu.edu.tw/handle/123456789/352470
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | M.-F. Wu | en_US |
dc.contributor.author | K.-S. Hu | en_US |
dc.contributor.author | J.-L. Huang | en_US |
dc.contributor.author | JIUN-LANG HUANG | zz |
dc.creator | M.-F. Wu;K.-S. Hu;J.-L. Huang | - |
dc.date.accessioned | 2018-09-10T07:43:03Z | - |
dc.date.available | 2018-09-10T07:43:03Z | - |
dc.date.issued | 2009-12 | - |
dc.identifier.uri | http://scholars.lib.ntu.edu.tw/handle/123456789/352470 | - |
dc.language | en | en |
dc.relation.ispartof | Journal of Electronic Testing: Theory and Applications | en_US |
dc.source | AH-anncc | - |
dc.title | LPTest: A Flexible Low-Power Test Pattern Generator | - |
dc.type | journal article | en |
dc.identifier.doi | 10.1007/s10836-009-5115-5 | - |
dc.identifier.scopus | 2-s2.0-73349124775 | - |
dc.identifier.isi | WOS:000272904500005 | - |
dc.relation.pages | 323-335 | - |
dc.relation.journalvolume | 25 | - |
dc.relation.journalissue | 6 | - |
item.fulltext | no fulltext | - |
item.openairecristype | http://purl.org/coar/resource_type/c_6501 | - |
item.cerifentitytype | Publications | - |
item.openairetype | journal article | - |
item.grantfulltext | none | - |
crisitem.author.dept | Electronics Engineering | - |
crisitem.author.dept | Electrical Engineering | - |
crisitem.author.dept | Program in Integrated Circuit Design and Automation | - |
crisitem.author.orcid | 0000-0002-9425-3855 | - |
crisitem.author.parentorg | College of Electrical Engineering and Computer Science | - |
crisitem.author.parentorg | College of Electrical Engineering and Computer Science | - |
crisitem.author.parentorg | Graduate School of Advanced Technology | - |
顯示於: | 電子工程學研究所 |
在 IR 系統中的文件,除了特別指名其著作權條款之外,均受到著作權保護,並且保留所有的權利。