https://scholars.lib.ntu.edu.tw/handle/123456789/372784
Title: | Influence of surface roughness and interfacial layer on the infrared spectra of V-CVD grown 3C-SiC/Si (100) epilayers | Authors: | CHEE-WEE LIU Talwar, D.N. Feng, Z.C. Liu, C.W. Tin, C.-C. CHEE-WEE LIU |
Issue Date: | 2012 | Journal Volume: | 27 | Journal Issue: | 11 | Source: | Semiconductor Science and Technology | URI: | http://www.scopus.com/inward/record.url?eid=2-s2.0-84868021839&partnerID=MN8TOARS http://scholars.lib.ntu.edu.tw/handle/123456789/372784 |
DOI: | 10.1088/0268-1242/27/11/115019 |
Appears in Collections: | 電機工程學系 |
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