Launch-on-Shift Test Generation for Testing Scan Designs Containing Synchronous and Asynchronous Clock Domains,
Journal
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Journal Volume
17
Journal Issue
4
Date Issued
2012-01
Author(s)
S. Wu
L. T. Wang
X. Wen
W. B. Jone
M. S. Hsiao
F. Li
J. C. M. Li
J. L. Huang
Type
journal article