https://scholars.lib.ntu.edu.tw/handle/123456789/378073| Title: | Interface trap redistribution and deep depletion behavior of non-planar MOS with ultra thin oxide grown by anodic oxidation | Authors: | Tseng, P.-H. Hwu, J.-G. JENN-GWO HWU |
Issue Date: | 2013 | Journal Volume: | 53 | Journal Issue: | 1 | Start page/Pages: | 331-341 | Source: | ECS Transactions | URI: | http://www.scopus.com/inward/record.url?eid=2-s2.0-84885623869&partnerID=MN8TOARS http://scholars.lib.ntu.edu.tw/handle/123456789/378073 |
DOI: | 10.1149/05301.0331ecst |
| Appears in Collections: | 電機工程學系 |
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