Skip to main content
English
中文
Log In
Log in
Log in with ORCID
NTU Single Sign On
Have you forgotten your password?
Home
College of Electrical Engineering and Computer Science / 電機資訊學院
Electronics Engineering / 電子工程學研究所
An IDDQ-Based Source Driver IC Design-for-Test Technique
Details
An IDDQ-Based Source Driver IC Design-for-Test Technique
Journal
International Conference on Computer-Aided Design
Pages
393-398
Date Issued
2013-11
Author(s)
S.-S. Lin
C.-L. Kao
J.-L. Huang
C.-C. Lee
X.-L. Huang
JIUN-LANG HUANG
DOI
10.1109/ICCAD.2013.6691148
URI
http://scholars.lib.ntu.edu.tw/handle/123456789/381697
Type
conference paper