https://scholars.lib.ntu.edu.tw/handle/123456789/388600
Title: | Subthreshold Behavior of the SOI NMOS Device Consdiering BJT and DIBL Effects | Authors: | D. H. Lung J. B. Kuo JAMES-B KUO |
Issue Date: | Jan-2014 | Source: | EUROSOI | URI: | http://scholars.lib.ntu.edu.tw/handle/123456789/388600 |
Appears in Collections: | 電機工程學系 |
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