https://scholars.lib.ntu.edu.tw/handle/123456789/392755
Title: | PWL: A progressive wear leveling to minimize data migration overheads for NAND flash devices | Authors: | Chen, F.-H. Yang, M.-C. Chang, Y.-H. TEI-WEI KUO |
Issue Date: | 2015 | Journal Volume: | 2015-April | Start page/Pages: | 1209-1212 | Source: | Design, Automation and Test in Europe | URI: | http://www.scopus.com/inward/record.url?eid=2-s2.0-84945961533&partnerID=MN8TOARS http://scholars.lib.ntu.edu.tw/handle/123456789/392755 |
Appears in Collections: | 資訊工程學系 |
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