2 μm emission from Si/Ge heterojunction LED and up to 1.55 μm detection by GOI detectors with strain-enhanced features
Journal
International Electron Devices Meeting
Journal Volume
2005
Pages
437-448
Date Issued
2005
Author(s)
Yu, C.-Y.
Huang, C.-F.
Lin, C.-H.
Lee, C.-J.
Yu, M.-H.
Chang, S.T.
Liang, C.-Y.
Lee, C.-Y.
Guo, T.-H.
Chang, C.-C.
Liu, C.W.
Type
conference paper