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College of Electrical Engineering and Computer Science / 電機資訊學院
Electronics Engineering / 電子工程學研究所
Fogging Effect Aware Placement in Electron Beam Lithography
Details
Fogging Effect Aware Placement in Electron Beam Lithography
Journal
Design Automation Conference
Journal Volume
Part 128280
Date Issued
2017
Author(s)
Huang, Y.-C.
Chang, Y.-W.
DOI
10.1145/3061639.3062252
URI
https://www.scopus.com/inward/record.uri?eid=2-s2.0-85023642530&doi=10.1145%2f3061639.3062252&partnerID=40&md5=290fc1f6ffca2067d51a711a4b17d0b8
https://scholars.lib.ntu.edu.tw/handle/123456789/405639
SDGs
[SDGs]SDG16
Type
conference paper