Electroless deposition of Cu thin films with CuCl2-HNO3 based chemistry - II. Kinetics and microstructure
Journal
Journal of the Electrochemical Society
Journal Volume
148
Journal Issue
5
Pages
C333-C338
Date Issued
2001
Author(s)
Abstract
This paper describes the kinetics involved in the acid-based electroless Cu deposition system employing chemistry in a buffer solution. The rate equation is set up as a function of concentrations of active chemical components involved, and rate orders are determined to evaluate the contribution from each component. The deposition rate of Cu is found most sensitive to variation in concentrations, followed by that of and The activation energy derived from deposition at different temperatures is 0.445 eV. Grain size of deposited Cu films is influenced strongly by deposition rate. Electrical resistivity of Cu films is dominated by the amount of point defects and microvoids present right after deposition, and by grain size after a 300°C anneal. © 2001 The Electrochemical Society. All rights reserved.
SDGs
Type
journal article