https://scholars.lib.ntu.edu.tw/handle/123456789/412404
Title: | Silicon Wafer Inspection Using Image Process Technology and Neural Network 應用影像處理技術與類神經網路於半導體之晶圓檢測 |
Authors: | 謝炎達 王朝興 張文亮 |
Source: | 中國工業工程學會95年度年會暨學術研討會論文集 | URI: | https://scholars.lib.ntu.edu.tw/handle/123456789/412404 |
Appears in Collections: | 生物環境系統工程學系 |
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