Skip to main content
English
中文
Log In
Log in
Log in with ORCID
NTU Single Sign On
Have you forgotten your password?
Home
College of Electrical Engineering and Computer Science / 電機資訊學院
Electrical Engineering / 電機工程學系
Pattern overlap implies runaway growth in hierarchical tile systems
Details
Pattern overlap implies runaway growth in hierarchical tile systems
Journal
Journal on Computational Geometry
Journal Volume
7
Journal Issue
2
Date Issued
2016
Author(s)
D. Doty
J. Manuch
A. Rafiey
L. Stacho
CHEN HO-LIN
DOI
10.4230/lipics.socg.2015.360
URI
https://scholars.lib.ntu.edu.tw/handle/123456789/413379
Type
journal article