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  4. Thermal fatigue life and reliability evaluation of die attachment layer of high power LED under thermal cycling conditions
 
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Thermal fatigue life and reliability evaluation of die attachment layer of high power LED under thermal cycling conditions

Journal
2014 International Conference on Information Science, Electronics and Electrical Engineering
Journal Volume
2
Pages
1030-1033
ISBN
9781479931965
Date Issued
2014
Author(s)
Hsu Y.
Wu W.-F.  
Lai S.-L.
DOI
10.1109/InfoSEEE.2014.6947825
URI
https://www.scopus.com/inward/record.uri?eid=2-s2.0-84913602122&doi=10.1109%2fInfoSEEE.2014.6947825&partnerID=40&md5=8b84d45ba69ce7f35f03ab7f162b4f70
https://scholars.lib.ntu.edu.tw/handle/123456789/414999
Abstract
Power conservation is a very important aspect of modern-day technology. With its long life and low energy consumption, the high power light emitting diode (HP LED) has become very popular for lighting purposes. The die attachment layer is an important component of an HP LED package that is susceptible to thermal fatigue failure and therefore affects the reliability of the HP LED itself. This study uses finite element method (FEM) to simulate and analyze the mechanical behavior of an HP LED die attachment layer under thermal cycling conditions. By using the numerical results of FEM as the input for the Coffin-Manson relationship, one can predict the thermal fatigue life of the LED. It is worth noting that past studies are mostly limited to finding a fixed value for the fatigue life of a package, which cannot truly reflect the discrete qualities of real life testing. Furthermore, they cannot provide vital information such as mean time to failure (MTTF) and the failure rate of the HP LED. With this in mind, this study considers uncertainties of both geometric dimensions and material properties of the die attachment layer, regarding them as random variables, which can be simulated by the Monte-Carlo method. The sample data is then applied to the FEM analysis for evaluating fatigue life of the LED package. By using the Anderson-Darling test and probability plot, one can find the probability distribution of the fatigue life as well as information such as MTTF and failure rate of the LED package. © 2014 IEEE.
Subjects
fatigue life; HP LED; reliability; thermal cycling
SDGs

[SDGs]SDG7

Other Subjects
Dies; Energy utilization; Fatigue of materials; Finite element method; Light emitting diodes; Monte Carlo methods; Outages; Probability distributions; Reliability; Safety engineering; Thermal cycling; Time-to-failure; Anderson-Darling tests; Geometric dimensions; High power light emitting diodes; Low energy consumption; Mechanical behavior; Power conservation; Reliability Evaluation; Thermal fatigue failures; Thermal fatigue
Publisher
Institute of Electrical and Electronics Engineers Inc.
Type
conference paper

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