|Title:||Phase transitions of room temperature RF-sputtered ZnO/Mg 0.4Zn 0.6O multilayer thin films after thermal annealing||Authors:||Chen J.Z.
|Keywords:||Annealing;Crystal microstructure;Magnesium zinc oxide;Multilayers;Phase transition;X-ray diffraction;Zinc oxide||Issue Date:||2012||Journal Volume:||520||Journal Issue:||6||Start page/Pages:||1918-1923||Source:||Thin Solid Films||Abstract:||
We report the thermal stability of room-temperature RF-sputtered Mg 0.4Zn 0.6O thin films and ZnO/Mg 0.4Zn 0.6O superlattices at 600 ¢XC and 800 ¢XC. The phase of room-temperature as-sputtered Mg 0.4Zn 0.6O is crystalline ZnO embedded in an amorphous or short-range-ordered hexagonal MgZnO matrix. Annealing at either 600 ¢XC or 800 ¢XC for 5 min transforms the matrix into a crystalline hexagonal wurtzite structure, leading to a decrease of the optical bandgap (E g) of Mg 0.4Zn 0.6O. This also results in a slight change near the absorption edge of the superlattice transmission spectrum. The films precipitate cubic MgZnO after heating Mg 0.4Zn 0.6O at 800 ¢XC for 5 min; by contrast, precipitations take at least 3 h if the samples are heated at 600 ¢XC. Heating at 800 ¢XC for more than 3 h significantly reduces the film thickness and E g, attributed to the decomposition of superlattices and diffusion of magnesium into the substrate, respectively. On the other hand, annealing the ZnO/Mg 0.4Zn 0.6O superlattice at 600 ¢XC for 12 h also produces an initial slight change in the optical transmission spectra, yet the spectra remain essentially unchanged for the remainder of the annealing process. ? 2011 Elsevier B.V. All rights reserved.
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