|Title:||High-speed force mapping based on an astigmatic atomic force microscope||Authors:||HSIEN-SHUN LIAO
|Keywords:||high-speed; force mapping; atomic force microscope||Issue Date:||2019||Publisher:||IOP PUBLISHING LTD||Journal Volume:||30||Journal Issue:||2||Source:||Measurement Science and Technology||Abstract:||
© 2019 IOP Publishing Ltd. The force mapping function in an atomic force microscope (AFM) can be used to measure mechanical properties at the nanoscale. Currently, the temporal and spatial resolutions of force mapping are mainly limited by the bandwidths of the scanner and the cantilever tip. The measurement speed can be improved by using an ultra-small cantilever tip. However, a customized read-out system is essential for detecting the cantilever deflection. In this study, a high-speed force mapping mode was built on an astigmatic high-speed AFM. The experimental results demonstrated that this homemade system achieved a high-speed force-curve rate of 6.1 kHz and scan rate of 12 line s-1 (21 s/frame) with an image resolution of 256 × 256 pixels. The sample stiffness mapping qualitatively distinguished the polystyrene and polyolefin elastomer materials.
|Appears in Collections:||機械工程學系|
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