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College of Electrical Engineering and Computer Science / 電機資訊學院
Communication Engineering / 電信工程學研究所
Spot and Learn: A Maximum-Entropy Image Patch Sampler for Few-Shot Classification
Details
Spot and Learn: A Maximum-Entropy Image Patch Sampler for Few-Shot Classification
Journal
IEEE International Conference on Computer Vision and Pattern Recognition (CVPR)
Pages
3861-3865
Date Issued
2019
Author(s)
W.-H. Chu
Y.-J. Li
J.-C. Chang
Y.-C. F. Wang
YU-CHIANG WANG
王鈺強
URI
https://scholars.lib.ntu.edu.tw/handle/123456789/427569
Type
conference paper