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College of Electrical Engineering and Computer Science / 電機資訊學院
Electrical Engineering / 電機工程學系
Local Thinning Induced Less Oxide Breakdown in MOS Structures Due to Lateral Non-Uniformity Effec
Details
Local Thinning Induced Less Oxide Breakdown in MOS Structures Due to Lateral Non-Uniformity Effec
Journal
Electrochemical Society Transactions,
Journal Volume
75
Journal Issue
5
Pages
31840-31853
Date Issued
2016
Author(s)
H.H.Lin
J.G.Hwu
JENN-GWO HWU
DOI
10.1149/07505.0063ecst
URI
https://scholars.lib.ntu.edu.tw/handle/123456789/429069
Type
journal article
