Experience in Simulation and Measurement of GaN FET Switching Behavior

Journal

IEEE International Future Energy Electronics Conference (IFEEC- ECCE Asia)

Pages

7763781:115-120

Date Issued

2017

Author(s)

C.-W. Ku

C.-J. Chen

Y.-C. Hsu

M.-N. Sun

DOI

10.1109/ifeec.2017.7992071

URI

https://scholars.lib.ntu.edu.tw/handle/123456789/429548

SDGs

[SDGs]SDG7

Type

conference paper