Measurement of two-pot S-parameters of an amplifier using one-port vector network analyzer
Journal
2016 APMC Asia-Pacific Microwave Conference
Date Issued
2016
Author(s)
Abstract
This paper describes a measurement technique to reconstruct the two-port scattering parameters of an amplifier from five one-port results measured by a vector network analyzer (VNA). Formulation on the use of auxiliary circuits and one-port VNA is given. The criterion in selecting the auxiliary circuit is also addressed. The reconstructed results are shown in close agreement with the directly measured results.
SDGs
Type
conference paper