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College of Engineering / 工學院
Materials Science and Engineering / 材料科學與工程學系
Effect of palladium content on microstructures, electrical and optical properties of NiO films by rf sputtering
Details
Effect of palladium content on microstructures, electrical and optical properties of NiO films by rf sputtering
Journal
Thin Solid Films
Journal Volume
549
Pages
50-53
Date Issued
2013
Author(s)
Chen S.C.
Kuo T.Y.
Lin Y.C.
Hsu S.W.
HSIN-CHIH LIN
DOI
10.1016/j.tsf.2013.07.017
URI
https://www.scopus.com/inward/record.uri?eid=2-s2.0-84888643390&doi=10.1016%2fj.tsf.2013.07.017&partnerID=40&md5=41fd48c20de57423ce1afa77040daba7
https://scholars.lib.ntu.edu.tw/handle/123456789/432434
Type
conference paper