Effect of palladium content on microstructures, electrical and optical properties of NiO films by rf sputtering

Journal

Thin Solid Films

Journal Volume

549

Pages

50-53

Date Issued

2013

Author(s)

Chen S.C.

Kuo T.Y.

Lin Y.C.

Hsu S.W.

DOI

10.1016/j.tsf.2013.07.017

URI

https://www.scopus.com/inward/record.uri?eid=2-s2.0-84888643390&doi=10.1016%2fj.tsf.2013.07.017&partnerID=40&md5=41fd48c20de57423ce1afa77040daba7

https://scholars.lib.ntu.edu.tw/handle/123456789/432434

Type

conference paper