Tin whisker growth induced by high electron current density

Journal

Journal of Electronic Materials

Journal Volume

37

Journal Issue

1

Pages

17-22

Date Issued

2008

Author(s)

Lin Y.W.

Lai Y.-S.

Lin Y.L.

Tu C.-T.

DOI

10.1007/s11664-007-0219-0

URI

https://www.scopus.com/inward/record.uri?eid=2-s2.0-37249026781&doi=10.1007%2fs11664-007-0219-0&partnerID=40&md5=6c1d7f818aa834ca036c00ebf40ac2af

https://scholars.lib.ntu.edu.tw/handle/123456789/432689

Type

journal article