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College of Engineering / 工學院
Materials Science and Engineering / 材料科學與工程學系
Tin whisker growth induced by high electron current density
Details
Tin whisker growth induced by high electron current density
Journal
2007 International Microsystems, Packaging, Assembly and Circuits Technology Conference
Pages
62-65
ISBN
9781424416370
Date Issued
2007
Author(s)
Lin Y.W.
C. ROBERT KAO
DOI
10.1109/IMPACT.2007.4433568
URI
https://www.scopus.com/inward/record.uri?eid=2-s2.0-48649084420&doi=10.1109%2fIMPACT.2007.4433568&partnerID=40&md5=f65b055957e4844892f75b649f668933
https://scholars.lib.ntu.edu.tw/handle/123456789/432693
Type
conference paper
