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College of Engineering / 工學院
Materials Science and Engineering / 材料科學與工程學系
Synchrotron X-ray micro-diffraction analysis on microstructure evolution in Sn under electromigratton
Details
Synchrotron X-ray micro-diffraction analysis on microstructure evolution in Sn under electromigratton
Journal
Materials Research Society Symposium
Journal Volume
863
Pages
363-367
Date Issued
2005
Author(s)
Wu A.T.
Tamura N.
Lloyd J.R.
Kao C.R.
Tu K.N.
C. ROBERT KAO
URI
https://www.scopus.com/inward/record.uri?eid=2-s2.0-28844455057&partnerID=40&md5=68ec5fa576e60ec4c56f3a01c740850e
https://scholars.lib.ntu.edu.tw/handle/123456789/432711
Type
conference paper