https://scholars.lib.ntu.edu.tw/handle/123456789/432711| Title: | Synchrotron X-ray micro-diffraction analysis on microstructure evolution in Sn under electromigratton | Authors: | Wu A.T. Tamura N. Lloyd J.R. Kao C.R. Tu K.N. C. ROBERT KAO |
Issue Date: | 2005 | Journal Volume: | 863 | Start page/Pages: | 363-367 | Source: | Materials Research Society Symposium | URI: | https://www.scopus.com/inward/record.uri?eid=2-s2.0-28844455057&partnerID=40&md5=68ec5fa576e60ec4c56f3a01c740850e https://scholars.lib.ntu.edu.tw/handle/123456789/432711 |
ISSN: | 02729172 |
| Appears in Collections: | 材料科學與工程學系 |
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