Skip to main content
English
中文
Log In
Log in
Log in with ORCID
NTU Single Sign On
Have you forgotten your password?
Home
College of Engineering / 工學院
Materials Science and Engineering / 材料科學與工程學系
Electromigration-induced microstructure evolution in tin studied by synchrotron x-ray microdiffraction
Details
Electromigration-induced microstructure evolution in tin studied by synchrotron x-ray microdiffraction
Journal
Applied Physics Letters
Journal Volume
85
Journal Issue
13
Pages
2490-2492
Date Issued
2004
Author(s)
Wu A.T.
Tu K.N.
Lloyd J.R.
Tamura N.
Valek B.C.
C. ROBERT KAO
DOI
10.1063/1.1795353
URI
https://www.scopus.com/inward/record.uri?eid=2-s2.0-7544234470&doi=10.1063%2f1.1795353&partnerID=40&md5=b1ad8bd64585b781cebbf177efb90fb8
https://scholars.lib.ntu.edu.tw/handle/123456789/432719
Type
journal article