https://scholars.lib.ntu.edu.tw/handle/123456789/432719| Title: | Electromigration-induced microstructure evolution in tin studied by synchrotron x-ray microdiffraction | Authors: | Wu A.T. Tu K.N. Lloyd J.R. Tamura N. Valek B.C. Kao C.R. C. ROBERT KAO |
Issue Date: | 2004 | Journal Volume: | 85 | Journal Issue: | 13 | Start page/Pages: | 2490-2492 | Source: | Applied Physics Letters | URI: | https://www.scopus.com/inward/record.uri?eid=2-s2.0-7544234470&doi=10.1063%2f1.1795353&partnerID=40&md5=b1ad8bd64585b781cebbf177efb90fb8 https://scholars.lib.ntu.edu.tw/handle/123456789/432719 |
ISSN: | 00036951 | DOI: | 10.1063/1.1795353 |
| Appears in Collections: | 材料科學與工程學系 |
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