https://scholars.lib.ntu.edu.tw/handle/123456789/432719
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Wu A.T. | en_US |
dc.contributor.author | Tu K.N. | en_US |
dc.contributor.author | Lloyd J.R. | en_US |
dc.contributor.author | Tamura N. | en_US |
dc.contributor.author | Valek B.C. | en_US |
dc.contributor.author | C. ROBERT KAO | en_US |
dc.creator | C. ROBERT KAO;Kao C.R.;Valek B.C.;Tamura N.;Lloyd J.R.;Tu K.N.;Wu A.T. | - |
dc.date.accessioned | 2019-11-27T02:03:03Z | - |
dc.date.available | 2019-11-27T02:03:03Z | - |
dc.date.issued | 2004 | - |
dc.identifier.issn | 00036951 | - |
dc.identifier.uri | https://www.scopus.com/inward/record.uri?eid=2-s2.0-7544234470&doi=10.1063%2f1.1795353&partnerID=40&md5=b1ad8bd64585b781cebbf177efb90fb8 | - |
dc.identifier.uri | https://scholars.lib.ntu.edu.tw/handle/123456789/432719 | - |
dc.relation.ispartof | Applied Physics Letters | - |
dc.title | Electromigration-induced microstructure evolution in tin studied by synchrotron x-ray microdiffraction | en_US |
dc.type | journal article | en |
dc.identifier.doi | 10.1063/1.1795353 | - |
dc.identifier.scopus | 2-s2.0-7544234470 | - |
dc.relation.pages | 2490-2492 | - |
dc.relation.journalvolume | 85 | - |
dc.relation.journalissue | 13 | - |
item.openairecristype | http://purl.org/coar/resource_type/c_6501 | - |
item.openairetype | journal article | - |
item.grantfulltext | none | - |
item.cerifentitytype | Publications | - |
item.fulltext | no fulltext | - |
crisitem.author.dept | Materials Science and Engineering | - |
crisitem.author.parentorg | College of Engineering | - |
顯示於: | 材料科學與工程學系 |
在 IR 系統中的文件,除了特別指名其著作權條款之外,均受到著作權保護,並且保留所有的權利。