https://scholars.lib.ntu.edu.tw/handle/123456789/432732
Title: | Electromigration in tin thin film | Authors: | Hu Y.C. Wan S.W. C. ROBERT KAO |
Issue Date: | 2002 | Publisher: | Institute of Electrical and Electronics Engineers Inc. | Start page/Pages: | 463-467 | Source: | 4th International Symposium on Electronic Materials and Packaging | URI: | https://www.scopus.com/inward/record.uri?eid=2-s2.0-84966605187&doi=10.1109%2fEMAP.2002.1188883&partnerID=40&md5=4bf87024f09f264e22023c32f4975455 https://scholars.lib.ntu.edu.tw/handle/123456789/432732 |
ISBN: | 078037682X 9780780376823 |
DOI: | 10.1109/EMAP.2002.1188883 |
Appears in Collections: | 材料科學與工程學系 |
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