Electronic and microstructure characterization of strontium-bismuth tantalate (SBT) thin films

Journal

Journal of the Korean Physical Society

Journal Volume

32

Journal Issue

4 SUPPL.

Pages

S1329-S1331

Date Issued

1998

Author(s)

Hartmann A.J.

Lamb R.N.

Scott J.F.

Johnston P.N.

El Bouanani M.

Chen C.W.

Robertson J.

URI

https://www.scopus.com/inward/record.uri?eid=2-s2.0-0032396464&partnerID=40&md5=b54066e00f3f5825ac56605aaafa8d91

https://scholars.lib.ntu.edu.tw/handle/123456789/432889

Type

journal article