https://scholars.lib.ntu.edu.tw/handle/123456789/432889| Title: | Electronic and microstructure characterization of strontium-bismuth tantalate (SBT) thin films | Authors: | Hartmann A.J. Lamb R.N. Scott J.F. Johnston P.N. El Bouanani M. Chen C.W. Robertson J. CHUN-WEI CHEN |
Issue Date: | 1998 | Journal Volume: | 32 | Journal Issue: | 4 SUPPL. | Start page/Pages: | S1329-S1331 | Source: | Journal of the Korean Physical Society | URI: | https://www.scopus.com/inward/record.uri?eid=2-s2.0-0032396464&partnerID=40&md5=b54066e00f3f5825ac56605aaafa8d91 https://scholars.lib.ntu.edu.tw/handle/123456789/432889 |
ISSN: | 03744884 |
| Appears in Collections: | 材料科學與工程學系 |
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