Temperature-dependence of interlayer exchange bias coupling in NiO/Cu/NiFe

Journal

Journal of Applied Physics

Journal Volume

89

Journal Issue

11

Pages

7540-7542

Date Issued

2001

Author(s)

Lin, M. T.

Ho, C. H.

Chang, C. R.

CHING-RAY CHANG

DOI

10.1063/1.1361259

URI

https://scholars.lib.ntu.edu.tw/handle/123456789/436636

Type

journal article