Thickness dependence of effective magnetic anisotropy
Journal
Journal of Applied Physics
Journal Volume
79
Journal Issue
8
Pages
4960-4962
Date Issued
1996
Author(s)
Abstract
Taking into account the occurrence probability of holes and imperfections we derive the nonlinear thickness dependence of the product Kt in very thin films. We predict both the usual 1/t and the recently observed 1/t2 dependence of the effective magnetic anisotropy K from the stochastic model. Agreement between theory and published experimental data is very good.
Type
journal article