Interfacial perfection for pushing InGaAs and Ge MOS device limits (invited)

Journal

2018 14th IEEE International Conference on Solid-State and Integrated Circuit Technology, ICSICT 2018 - Proceedings

Date Issued

2018

Author(s)

Lin, Y.H.

Wan, H.W.

Chen, W.S.

Cheng, Y.T.

Cheng, C.P.

Pi, T.W.

Kwo, J.

DOI

URI

URL

Type

conference paper