https://scholars.lib.ntu.edu.tw/handle/123456789/443421
Title: | High-quality nanothick single-crystal Y2 O3 films epitaxially grown on Si (111): Growth and structural characteristics | Authors: | Lee, Y.J. Lee, W.C. Nieh, C.W. Yang, Z.K. Kortan, A.R. Hong, M. Kwo, J. Hsu, C.-H. MINGHWEI HONG |
Issue Date: | 2008 | Journal Volume: | 26 | Journal Issue: | 3 | Start page/Pages: | 1124-1127 | Source: | Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures | URI: | https://scholars.lib.ntu.edu.tw/handle/123456789/443421 | DOI: | 10.1116/1.2889387 |
Appears in Collections: | 物理學系 |
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