Inelastic electron tunneling spectroscopy study of metal-oxide- semiconductor diodes based on high-庥 gate dielectrics

Journal

Applied Physics Letters

Journal Volume

92

Journal Issue

1

Date Issued

2008

Author(s)

You, S.L.

Huang, C.C.

Wang, C.J.

Ho, H.C.

Kwo, J.

Lee, W.C.

Lee, K.Y.

Wu, Y.D.

Lee, Y.J.

DOI

10.1063/1.2831717

URI

https://scholars.lib.ntu.edu.tw/handle/123456789/443430

URL

https://www.scopus.com/inward/record.uri?eid=2-s2.0-38049092424&doi=10.1063%2f1.2831717&partnerID=40&md5=ea01e9f4557b80d30b4b948d5414ca92

Type

journal article