https://scholars.lib.ntu.edu.tw/handle/123456789/443453| Title: | Measuring interface strains at the atomic resolution in depth using x-ray Bragg-surface diffraction | Authors: | Sun, W.C. Chang, H.C. Wu, B.K. Chen, Y.R. Chu, C.H. Chang, S.L. Hong, M. Tang, M.T. Stetsko, Y.P. MINGHWEI HONG |
Issue Date: | 2006 | Journal Volume: | 89 | Journal Issue: | 9 | Source: | Applied Physics Letters | URI: | https://scholars.lib.ntu.edu.tw/handle/123456789/443453 | DOI: | 10.1063/1.2345023 |
| Appears in Collections: | 物理學系 |
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