Measuring interface strains at the atomic resolution in depth using x-ray Bragg-surface diffraction

Journal

Applied Physics Letters

Journal Volume

89

Journal Issue

9

Date Issued

2006

Author(s)

Sun, W.C.

Chang, H.C.

Wu, B.K.

Chen, Y.R.

Chu, C.H.

Chang, S.L.

Tang, M.T.

Stetsko, Y.P.

DOI

10.1063/1.2345023

URI

https://scholars.lib.ntu.edu.tw/handle/123456789/443453

URL

https://www.scopus.com/inward/record.uri?eid=2-s2.0-33748253659&doi=10.1063%2f1.2345023&partnerID=40&md5=c57513e5ed02667a5aca7967433e844c

Type

journal article