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College of Science / 理學院
Physics / 物理學系
Probing the microscopic compositions at Ga<inf>2</inf>O<inf>3</inf>(Gd<inf>2</inf>O<inf>3</inf>)/GaAs interface by core level photoelectron spectroscopy
Details
Probing the microscopic compositions at Ga2O3(Gd2O3)/GaAs interface by core level photoelectron spectroscopy
Journal
Solid-State Electronics
Journal Volume
45
Journal Issue
3
Pages
423-426
Date Issued
2001
Author(s)
Lay, T.S.
Huang, K.H.
Hung, W.H.
MINGHWEI HONG
Kwo, J.
Mannaerts, J.P.
DOI
10.1016/S0038-1101(01)00049-1
URI
https://scholars.lib.ntu.edu.tw/handle/123456789/443477
URL
https://www.scopus.com/inward/record.uri?eid=2-s2.0-0035275930&doi=10.1016%2fS0038-1101%2801%2900049-1&partnerID=40&md5=0a71379181f83f9a34dbbb8034154412
Type
journal article