Extended x-ray absorption fine-structure measurement of bond-length strain in epitaxial Gd2O3 on GaAs(001)

Journal

Applied Physics Letters

Journal Volume

76

Journal Issue

18

Pages

2526-2528

Date Issued

2000

Author(s)

Nelson, E.J.

Woicik, J.C.

Kwo, J.

Mannaerts, J.P.

DOI

10.1063/1.126397

URI

https://scholars.lib.ntu.edu.tw/handle/123456789/443481

URL

https://www.scopus.com/inward/record.uri?eid=2-s2.0-0012479746&doi=10.1063%2f1.126397&partnerID=40&md5=df0512e98b5ccb1e09bd9136b8b26343

Type

journal article