Skip to main content
English
中文
Log In
Log in
Log in with ORCID
NTU Single Sign On
Have you forgotten your password?
Home
College of Engineering / 工學院
Chemical Engineering / 化學工程學系
Minority lifetime degradation of silicon wafers after electric zone melting
Details
Minority lifetime degradation of silicon wafers after electric zone melting
Journal
Journal of Crystal Growth
Journal Volume
420
Pages
74-79
Date Issued
2015
Author(s)
Wu, M.C.
Yang, C.F.
Lan, C.W.
CHUNG-WEN LAN
DOI
10.1016/j.jcrysgro.2015.03.041
URI
https://scholars.lib.ntu.edu.tw/handle/123456789/444847
URL
https://www.scopus.com/inward/record.uri?eid=2-s2.0-84926686316&doi=10.1016%2fj.jcrysgro.2015.03.041&partnerID=40&md5=46c9742bfc9e54e6ca09fc83afe9eae0
SDGs
[SDGs]SDG7
Type
journal article