Microstructure, resistivity and the anisotropy of the upper critical field in NbN thin films

Journal

IEEE Transactions on Magnetics

Journal Volume

23

Journal Issue

2

Pages

831-838

Date Issued

1987

Author(s)

Rudman, D.

J. Juang

R. van Dover

Nakahara, S.

Capone, D.

Talvacchio, J.

DOI

10.1109/TMAG.1987.1065011

URI

https://scholars.lib.ntu.edu.tw/handle/123456789/447604

URL

http://ieeexplore.ieee.org/document/1065011/

Type

journal article