https://scholars.lib.ntu.edu.tw/handle/123456789/447815
Title: | Full-field microsurface profilometry using image correlation without vertical scanning | Authors: | Wu, G.-W. Nguyen, D.T. Chen, L.-C. LIANG-CHIA CHEN |
Issue Date: | 2019 | Journal Volume: | 44 | Journal Issue: | 14 | Start page/Pages: | 3534-3537 | Source: | Optics Letters | URI: | https://scholars.lib.ntu.edu.tw/handle/123456789/447815 | DOI: | 10.1364/OL.44.003534 |
Appears in Collections: | 機械工程學系 |
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