Skip to main content
English
中文
Log In
Log in
Log in with ORCID
NTU Single Sign On
Have you forgotten your password?
Home
College of Engineering / 工學院
Mechanical Engineering / 機械工程學系
Accurate submicron edge detection using the phase change of a nano-scale shifting laser spot
Details
Accurate submicron edge detection using the phase change of a nano-scale shifting laser spot
Journal
Optics and Laser Technology
Journal Volume
92
Pages
109-119
Date Issued
2017
Author(s)
Hai, H.H.
Chen, L.-C.
Nguyen, D.T.
Lin, S.-T.
Yeh, S.L.
Yao, Y.
LIANG-CHIA CHEN
DOI
10.1016/j.optlastec.2017.01.006
URI
https://scholars.lib.ntu.edu.tw/handle/123456789/447820
URL
https://www.scopus.com/inward/record.uri?eid=2-s2.0-85010297074&doi=10.1016%2fj.optlastec.2017.01.006&partnerID=40&md5=7250d52fdc3d910001d7365c8a7a4f11
Type
journal article