https://scholars.lib.ntu.edu.tw/handle/123456789/447978| Title: | The correlation between trap states and mechanical reliability of amorphous Si:H TFTS for flexible electronics | Authors: | Lee, M.H. Chang, S.T. Weng, S.-C. Liu, W.-H. Chen, K.-J. Ho, K.-Y. Liao, M.H. Huang, J.-J. Hu, G.-R. MING-HAN LIAO |
Issue Date: | 2009 | Start page/Pages: | 956-959 | Source: | IEEE International Reliability Physics Symposium Proceedings | URI: | https://scholars.lib.ntu.edu.tw/handle/123456789/447978 | DOI: | 10.1109/IRPS.2009.5173388 |
| Appears in Collections: | 機械工程學系 |
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