Raman scattering and X-ray absorption from CVD grown 3C-SiC on Si
Journal
Materials Science Forum
Journal Volume
717-720
Pages
505-508
Date Issued
2012
Author(s)
Feng, Z.C.
Chen, C.
Xu, Q.
Mendis, S.P.
Jang, L.-Y.
Tin, C.-C.
Lee, K.-Y.
Liu, C.W.
Wu, Z.
Abstract
FTIR, Visible and UV Raman scattering, as well as synchrotron radiation X-ray absorption, in combination, have been employed to investigate a series of CVD grown 3C-SiC/Si (100). Significant results on the optical and atomic bonding properties are obtained from these comparative studies. © (2012) Trans Tech Publications.
Type
conference paper