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College of Engineering / 工學院
Industrial Engineering / 工業工程學研究所
Dominance index for many-to-many correlation and its applicaions to semiconductor yield analysis
Details
Dominance index for many-to-many correlation and its applicaions to semiconductor yield analysis
Journal
Winter Simulation Conference
Date Issued
2012
Author(s)
Hong, A.
ARGON CHEN
DOI
10.1109/WSC.2012.6465276
URI
https://scholars.lib.ntu.edu.tw/handle/123456789/467238
URL
https://www.scopus.com/inward/record.uri?eid=2-s2.0-84874714522&doi=10.1109%2fWSC.2012.6465276&partnerID=40&md5=911385d7670071e46a0abc8a18e9868c
Type
conference paper