A bist RAM architecture with parallel testing in a microprogram ROM

Journal

Journal of the Chinese Institute of Engineers, Transactions of the Chinese Institute of Engineers,Series A/Chung-kuo Kung Ch'eng Hsuch K'an

Journal Volume

16

Journal Issue

5

Pages

685-690

Date Issued

1993

Author(s)

Huang, J.-M.

DOI

URI

URL

Type

journal article