Universality of the electronic structure from a half-filled CuO2 plane

Journal

Physical Review B - Condensed Matter and Materials Physics

Journal Volume

67

Journal Issue

3

Pages

351131-3511316

Date Issued

2003

Author(s)

Ronning, F.

Kim, C.

Shen, K. M.

Armitage, N. P.

Damascelli, A.

Lu, D. H.

Feng, D. L.

Shen, Z. X.

Miller, L. L.

Kim, Y. J.

Terasaki, I.

URI

https://www.scopus.com/record/display.uri?eid=2-s2.0-0037438270&origin=resultslist&sort=plf-f&src=s&st1=Universality+of+the+electronic+structure+from+a+half-filled+CuO2+plane&st2=&sid=a5ae368deb0b540f28f5af71e5a8bd71&sot=b&sdt=b&sl=85&s=TITLE-ABS-KEY%28Universality+of+the+electronic+structure+from+a+half-filled+CuO2+plane%29&relpos=0&citeCnt=18&searchTerm=

https://scholars.lib.ntu.edu.tw/handle/123456789/485146

Type

journal article