Effects of drain-bias and ambient on hump formation in the transfer curves of positively gate-biased MgZnO thin film transistors

Journal

Thin Solid Films

Journal Volume

529

Pages

360-363

Date Issued

2013

Author(s)

Tsai, Y.-S.

Li, C.-H.

Chiu, I.-C.

Chin, H.-A.

JIAN-ZHANG CHEN

DOI

10.1016/j.tsf.2012.06.028

URI

https://scholars.lib.ntu.edu.tw/handle/123456789/486643

URL

https://www.scopus.com/inward/record.uri?eid=2-s2.0-84873733535&doi=10.1016%2fj.tsf.2012.06.028&partnerID=40&md5=1d379020791d1460e1c1db5af029895a

Type

conference paper