Reliability of active-matrix organic light-emitting-diode arrays with amorphous silicon thin-film transistor backplanes on clear plastic
Journal
IEEE Electron Device Letters
Journal Volume
29
Journal Issue
1
Pages
63-66
Date Issued
2008
Author(s)
Hekmatshoar, B.
Kattamis, A.Z.
Cherenack, K.H.
Long, K.
Chen, J.-Z.
Wagner, S.
Sturm, J.C.
Rajan, K.
Hack, M.
Abstract
We have fabricated active-matrix organic light emitting diode (AMOLED) test arrays on an optically clear high-temperature flexible plastic substrate at process temperatures as high as 285 degC using amorphous silicon thin-film transistors (a-Si TFTs). The substrate transparency allows for the operation of AMOLED pixels as bottom-emission devices, and the improved stability of the a-Si TFTs processed at higher temperatures significantly improves the reliability of the light emission over time.
SDGs
Type
journal article