Integration of partial scan and built-in self-test.

Journal

J. Electronic Testing

Journal Volume

7

Journal Issue

1-2

Pages

125-137

Date Issued

1995

Author(s)

Lin, Chih-Jen

Zorian, Yervant

Bhawmik, Sudipta

DOI

10.1007/BF00993320

URI

https://scholars.lib.ntu.edu.tw/handle/123456789/488000

URL

https://doi.org/10.1007/BF00993320

Type

journal article