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College of Electrical Engineering and Computer Science / 電機資訊學院
Computer Science and Information Engineering / 資訊工程學系
Integration of partial scan and built-in self-test.
Details
Integration of partial scan and built-in self-test.
Journal
J. Electronic Testing
Journal Volume
7
Journal Issue
1-2
Pages
125-137
Date Issued
1995
Author(s)
Lin, Chih-Jen
Zorian, Yervant
Bhawmik, Sudipta
CHIH-JEN LIN
DOI
10.1007/BF00993320
URI
https://scholars.lib.ntu.edu.tw/handle/123456789/488000
URL
https://doi.org/10.1007/BF00993320
Type
journal article