https://scholars.lib.ntu.edu.tw/handle/123456789/488000| Title: | Integration of partial scan and built-in self-test. | Authors: | Lin, Chih-Jen Zorian, Yervant Bhawmik, Sudipta CHIH-JEN LIN |
Issue Date: | 1995 | Journal Volume: | 7 | Journal Issue: | 1-2 | Start page/Pages: | 125-137 | Source: | J. Electronic Testing | URI: | https://scholars.lib.ntu.edu.tw/handle/123456789/488000 | DOI: | 10.1007/BF00993320 |
| Appears in Collections: | 資訊工程學系 |
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